Bennett, H.
, Lowney, J.
, Tomizawa, M.
and Ishibashi, T.
(1992),
Experimentally Verified Majority and Minority Mobilities in Heavily Doped GaAs for Device Simulations, Complete paper, IEIC Trans. Electron. (Japanese)
(Accessed April 26, 2024)
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Experimentally Verified Majority and Minority Mobilities in Heavily Doped GaAs for Device Simulations, Complete paper
Published
Author(s)
, , M. Tomizawa, T. Ishibashi
Citation
IEIC Trans. Electron. (Japanese)
Volume
E75-C
Issue
2
Pub Type
Journals
Citation
Created January 31, 1992, Updated October 12, 2021