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Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Published
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
Abstract
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study illustrates the important role of the return path in determining the electromagnetic coupling between the lines.
Arz, U.
, Williams, D.
and Grabinski, H.
(2001),
Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines, 2001 Elect. Perform. of Electronic Pkg., Boston, MA, USA
(Accessed March 29, 2024)