Jesch, R.
(1977),
Evaluation of low-losslow-reflection two-port devices or adapters by automated measurement techniques:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.78-870
(Accessed December 5, 2024)
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Evaluation of low-losslow-reflection two-port devices or adapters by automated measurement techniques:
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- NBS IR 78-870
Report Number
NBS IR 78-870
Pub Type
NIST Pubs
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Created January 1, 1977, Updated May 19, 2023