TY  - GEN
AU  - Ramon L Jesch
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1977-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.78-870
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1977
TI  - Evaluation of low-losslow-reflection two-port devices or adapters by automated measurement techniques:
ER  -