Obrzut, J.
, Chiang, C.
, Popielarz, R.
and Nozaki, R.
(2000),
Evaluation of dielectric properties of polymer thin-film materials for application in embedded capacitance:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6537
(Accessed December 12, 2024)
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Evaluation of dielectric properties of polymer thin-film materials for application in embedded capacitance:
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- NIST IR 6537
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NIST IR 6537
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NIST Pubs
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Created January 1, 2000, Updated May 20, 2023