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Evaluation of dielectric properties of polymer thin-film materials for application in embedded capacitance:

Published

Author(s)

Jan Obrzut, C K Chiang, R Popielarz, R Nozaki
Citation
- NIST IR 6537
Report Number
NIST IR 6537

Citation

Obrzut, J. , Chiang, C. , Popielarz, R. and Nozaki, R. (2000), Evaluation of dielectric properties of polymer thin-film materials for application in embedded capacitance:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6537 (Accessed July 25, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2000, Updated May 20, 2023