Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Estimating t-way Fault Profile Evolution During Testing

Published

Author(s)

David R. Kuhn, Raghu N. Kacker, Lei Yu

Abstract

Empirical studies have shown that most software interaction faults involve one or two variables interacting, with progressively fewer triggered by three or more, and no failure has been reported involving more than six variables interacting. This paper introduces a hypothesis for the origin of this distribution, with implications for removal of interaction faults and reliability growth.
Conference Dates
June 10-14, 2016
Conference Location
Atlanta, GA
Conference Title
IEEE Conference on Computers, Software & Applications

Keywords

combinatorial testing, software fault, testing

Citation

Kuhn, D. , Kacker, R. and Yu, L. (2016), Estimating t-way Fault Profile Evolution During Testing, IEEE Conference on Computers, Software & Applications, Atlanta, GA, [online], https://doi.org/10.1109/COMPSAC.2016.110 (Accessed July 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 25, 2016, Updated November 10, 2018