Enhancing the accuracy of atomic force microscopy measurements of Young's modulus via force-curve-informed tip geometry fitting

Published

December 10, 2025

Author(s)

Jason Killgore, Timothy Weeks, Filippo Mangolini, Logan Kirsch, Gregory Rodin

Abstract

Atomic force microscopy (AFM) is widely used for nanoscale mechanical testing. However, extracting Young's modulus from the force vs. indentation depth data remains a challenge. In this regard, uncertainties about the AFM tip geometry have been recognized as a major source of errors. Here, we propose a methodology in which the geometric approximation of the AFM tip is informed by the force vs. indentation depth data. The methodology is based on two least-square fits, one involving the force vs. indentation depth data and the other the tip profile. At the core of our methodology is the proposition that the tip geometry must be properly characterized in the interval bounded by the contact radius corresponding to the maximum indentation depth. This proposition has a solid geometric underpinning and does not require any additional assumptions. Further, there are no conceptual obstacles to applying the methodology to multi-parameter geometric models, including those based on raw image data. The methodology is successfully applied to both synthetic and physical data.

Citation

Small Methods

Pub Type

Journals

Download Paper

https://doi.org/10.1016/j.mtnano.2025.100728

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Keywords

nanomechanics, atomic force microscopy

Citation

Killgore, J. , Weeks, T. , Mangolini, F. , Kirsch, L. and Rodin, G. (2025), Enhancing the accuracy of atomic force microscopy measurements of Young's modulus via force-curve-informed tip geometry fitting, Small Methods, [online], https://doi.org/10.1016/j.mtnano.2025.100728, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=960058 (Accessed April 22, 2026)