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PUBLICATIONS

The Electromigration Damage Response Time and Implications for dc and Pulsed Characterizations

Published

Author(s)

John S. Suehle, Harry A. Schafft
Proceedings Title
Proc. Intl. Reliability Physics Symposium
Conference Dates
April 11-13, 1989
Conference Location
Phoenix, AZ, USA
Pub Type
Conferences

Citation

Suehle, J. and Schafft, H. (1989), The Electromigration Damage Response Time and Implications for dc and Pulsed Characterizations, Proc. Intl. Reliability Physics Symposium, Phoenix, AZ, USA (Accessed October 23, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1989, Updated October 12, 2021
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