@conference{846891,
  author = {John Suehle and Harry Schafft},
  title = {The Electromigration Damage Response Time and Implications for dc and Pulsed Characterizations},
  year = {1989},
  month = {1989-12-31 00:12:00},
  publisher = {Proc. Intl. Reliability Physics Symposium, Phoenix, AZ, USA},
  language = {en},
}