We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between the time and frequency domains. Once calibrated, the photodiode can be used as a known source, providing traceability to both time- and frequency-domain based equipment, including oscilloscopes, vector signal generators, vector signal analyzers, and large signal network analyzers.
Proceedings Title: IEEE MTT 2010 International Microwave Symposium
Conference Dates: May 23-28, 2010
Conference Location: Anaheim, CA
Conference Title: IEEE MTT 2010 International Microwave Symposium Workshop WMF "Ultra-high speed microwave and photonic devices and systems: How will they be tested"
Pub Type: Conferences
Electro-optic sampling, oscilloscope, photodiode