Ashton, J.
, Lenahan, P.
, Lichtenwalner, D.
, Lelis, A.
and Anders, M.
(2019),
Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal- oxide-semiconductor field-effect transistors, Journal of Applied Physics, [online], https://doi.org/10.1063/1.5120704, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929100
(Accessed April 19, 2024)
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Electrically detected magnetic resonance study of barium and nitric oxide treatments of 4H-SiC metal- oxide-semiconductor field-effect transistors
Published
Author(s)
James Ashton, Patrick M. Lenahan, D. J. Lichtenwalner, Aivars Lelis,
Citation
Journal of Applied Physics
Volume
126
Issue
14
Pub Type
Journals
Download Paper
Citation
Created October 9, 2019, Updated October 12, 2021