The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement.
Proceedings Title: Proc., URSI General Assembly
Conference Dates: August 13-21, 1999
Conference Location: Toronto, CA
Pub Type: Conferences
electronic packaging, interconnections, measurements, network analysis