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Electrical material property measurements using a free-field, ultra-wideband system

Published

Author(s)

Chriss A. Grosvenor, Robert T. Johnk, David R. Novotny, Seturnino Canales, James R. Baker-Jarvis, Michael D. Janezic, Jim L. Drewniak, Marina Kolednitseva, Jianmin Zhang, Poornachander Rawa

Abstract

Abstract: Nondestructive measurements of materials using TEM horn antennas and an ultra-wideband measurement system are presented. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.
Proceedings Title
2004 IEEE Conference on Electrical Insulation and Dielectric Phenomena
Conference Dates
October 17-20, 2004
Conference Location
Boulder, CO

Keywords

dielectric measurements, genetic algorithms, TEM horn antennas, Time-domain, ultra-wideband system

Citation

Grosvenor, C. , Johnk, R. , Novotny, D. , Canales, S. , Baker-Jarvis, J. , Janezic, M. , Drewniak, J. , Kolednitseva, M. , Zhang, J. and Rawa, P. (2004), Electrical material property measurements using a free-field, ultra-wideband system, 2004 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Boulder, CO (Accessed March 4, 2024)
Created October 1, 2004, Updated February 19, 2017