Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies

Published

Author(s)

M Giraud, Tinh Nguyen, Xiaohong Gu, Mark R. VanLandingham

Abstract

The effects of stoichiometry and epoxy molecular mass on surface and interfacial microstructures and wettability of amine-cured epoxies have been investigated. Thin (150 m) amine-cured epoxy films were prepared by reacting epoxy resins having sixdifferent equivalent epoxide masses ranging from 185 g to 3050 g with a polyoxyalkyleneamine curing agent at three different stoichiometries. The microstructures of the film/air and film/silicon substrate interfaces were measured by atomic force microscopy (AFM) in the tapping mode using both phase and topographic imaging techniques. Cross-sectional interphases between the epoxy films and steel substrate were characterized by AFM. Surface free energy, surface polarity, work of adhesion, and acid-base parameters of the film surfaces were calculated using contact angles of water, methylene iodide, and formamide liquids. All amine-cured epoxy films show a two-phase microstructure consisting of nodular domains surrounded by a matrix. Both the molecular mass and stoichiometry have a strong influence on the size of the nodular domains of both the film/air and film/substrate interfaces. However, both the molecular mass and stoichiometry had only a small effect on the wettability parameters.
Proceedings Title
24th Annual Meeting of the Adhesion Society
Conference Dates
February 25-28, 2001
Conference Title
Adhesion Society

Keywords

epoxy molecular mass, stoichiometry

Citation

Giraud, M. , Nguyen, T. , Gu, X. and VanLandingham, M. (2001), Effects of Stoichiometry and Epoxy Molecular Mass on Wettability and Interfacial Microstructures of Amine-Cured Epoxies, 24th Annual Meeting of the Adhesion Society (Accessed July 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 1, 2001, Updated February 19, 2017