Boundary migration of ZnO has been investigated using single crystals with defined crystallographic orientations. The migration rate of the basal C planes depended on the crystallographic polarity: Zn-terminated positive (0001)-planes. The migration in the non-polar directon was similar to that in the positive polarity direction. A ledge mechanism is suggested to be responsible for the grain boundary migration. These results explain the development of elongated grains in typical ZnO varistor ceramics.
Citation: American Ceramic Society Bulletin
Pub Type: Journals
grain boundary migration, grain growth, zinc oxides, ZnO