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PUBLICATIONS

The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits

Published

Author(s)

John S. Suehle, Kathleen Gallo
Citation
Microelectronics Journal
Volume
21
Issue
3
Pub Type
Journals

Citation

Suehle, J. and Gallo, K. (1990), The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits, Microelectronics Journal (Accessed November 11, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 31, 1990, Updated October 12, 2021
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