Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits

Published

Author(s)

John S. Suehle, Kathleen Gallo
Citation
Microelectronics Journal
Volume
21
Issue
3

Citation

Suehle, J. and Gallo, K. (1990), The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits, Microelectronics Journal (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 1990, Updated October 12, 2021