Wiederhorn, S.
and Tighe, N.
(1977),
Effect of flaw generation on proof-testing:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.77-1408 (Accessed June 19, 2026)
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Effect of flaw generation on proof-testing:
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- NBS IR 77-1408
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NBS IR 77-1408
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NIST Pubs
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Created January 1, 1977, Updated May 19, 2023