TY - GEN AU - Wiederhorn, S M AU - Tighe, N J C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1977-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.IR.77-1408 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1977 TI - Effect of flaw generation on proof-testing: ER -