Remley, K.
, de Carvalho, N.
and Root, D.
(2006),
Editorial for IEEE Transactions on Microwave Theory and Techniques Mini-Special Issue on Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems, IEEE Transactions on Microwave Theory and Techniques
(Accessed April 26, 2024)
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Editorial for IEEE Transactions on Microwave Theory and Techniques Mini-Special Issue on Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems
Published
Author(s)
, Nuno de Carvalho, David Root
Abstract
As Guest Editors, we are honored and excited to introduce this Mini-Special Issue of the Transactions devoted to Measurements for Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems. Large-signal measurements reveal the detailed, often extremely rich, nonlinear dynamical responses exhibited by analog microwave devices, circuits, and systems in conditions of actual use in a way that static (DC) and linear (S-parameter) measurements simply cannot. In other words, large-signal measurements provide the quantitative basis for both scientific understanding and engineering exploitation of real-world nonlinear devices, circuits, and systems.Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
54
Issue
8
Pub Type
Journals
Keywords
large-signal measurements, nonlinear characterization
Citation
Created July 31, 2006, Updated October 12, 2021