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Editorial for IEEE Transactions on Microwave Theory and Techniques Mini-Special Issue on Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems

Published

Author(s)

Kate Remley, Nuno de Carvalho, David Root

Abstract

As Guest Editors, we are honored and excited to introduce this Mini-Special Issue of the Transactions devoted to Measurements for Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems. Large-signal measurements reveal the detailed, often extremely rich, nonlinear dynamical responses exhibited by analog microwave devices, circuits, and systems in conditions of actual use in a way that static (DC) and linear (S-parameter) measurements simply cannot. In other words, large-signal measurements provide the quantitative basis for both scientific understanding and engineering exploitation of real-world nonlinear devices, circuits, and systems.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
54
Issue
8

Keywords

large-signal measurements, nonlinear characterization

Citation

Remley, K. , de Carvalho, N. and Root, D. (2006), Editorial for IEEE Transactions on Microwave Theory and Techniques Mini-Special Issue on Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems, IEEE Transactions on Microwave Theory and Techniques (Accessed March 1, 2024)
Created July 31, 2006, Updated October 12, 2021