Dragnea, B.
, Szarko, J.
, Preusser, J.
and Leone, S.
(2021),
Direct Optical Measurement of the Dither Amplitude of a Near-Field Microscope Aperture on a Nanometer, Review of Scientific Instruments (Accessed April 24, 2026)
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Direct Optical Measurement of the Dither Amplitude of a Near-Field Microscope Aperture on a Nanometer
Published
Author(s)
B Dragnea, J Szarko, J Preusser,
Abstract
A new confocal optical method for measuring the dithering amplitude of an aperture near-field optical microscope tip is presented. The methodis direct and absolute, and it provides enough sensitivity to determine movements as small as 5 nm amplitude. Its simplicity provides the opticalnear-field researcher with an in-situ characterization tool for the mechanical properties of the piezo-driver/tuning fork/tip assembly, which is used for the distance control above the sample in most near-field microscopes.Citation
Review of Scientific Instruments
Pub Type
Journals
Keywords
confocal microscope, near-field
Citation
Issues
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Created October 12, 2021