Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Direct Optical Measurement of the Dither Amplitude of a Near-Field Microscope Aperture on a Nanometer

Published

Author(s)

B Dragnea, J Szarko, J Preusser, S R. Leone

Abstract

A new confocal optical method for measuring the dithering amplitude of an aperture near-field optical microscope tip is presented. The methodis direct and absolute, and it provides enough sensitivity to determine movements as small as 5 nm amplitude. Its simplicity provides the opticalnear-field researcher with an in-situ characterization tool for the mechanical properties of the piezo-driver/tuning fork/tip assembly, which is used for the distance control above the sample in most near-field microscopes.
Citation
Review of Scientific Instruments

Keywords

confocal microscope, near-field

Citation

Dragnea, B. , Szarko, J. , Preusser, J. and Leone, S. (2021), Direct Optical Measurement of the Dither Amplitude of a Near-Field Microscope Aperture on a Nanometer, Review of Scientific Instruments (Accessed February 29, 2024)
Created October 12, 2021