Fowler, H.
, Devaney, J.
, Hagedorn, J.
and Sullivan, F.
(1998),
Dielectric breakdown in a simplified parallel model:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6174
(Accessed December 2, 2024)
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Dielectric breakdown in a simplified parallel model:
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- NIST IR 6174
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NIST IR 6174
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NIST Pubs
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Created January 1, 1998, Updated May 20, 2023