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Dielectric breakdown in a simplified parallel model:



Howland A Fowler, Judith E Devaney, John G Hagedorn, Francis E Sullivan
- NIST IR 6174
Report Number
NIST IR 6174


Fowler, H. , Devaney, J. , Hagedorn, J. and Sullivan, F. (1998), Dielectric breakdown in a simplified parallel model:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], (Accessed July 14, 2024)


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Created January 1, 1998, Updated May 20, 2023