TY  - GEN
AU  - Fowler, Howland A
AU  - Devaney, Judith E
AU  - Hagedorn, John G
AU  - Sullivan, Francis E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1998-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6174
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1998
TI  - Dielectric breakdown in a simplified parallel model:
ER  -