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Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers ::annual report, December 1, 1978 to November 30, 1979

Published

Author(s)

G P Carver, S Rubin
Citation
- NBS IR 80-2000
Report Number
NBS IR 80-2000

Citation

Carver, G. and Rubin, S. (1980), Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers ::annual report, December 1, 1978 to November 30, 1979, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.80-2000 (Accessed May 26, 2024)

Issues

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Created January 1, 1980, Updated May 19, 2023