Carver, G.
and Rubin, S.
(1980),
Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers ::annual report, December 1, 1978 to November 30, 1979, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.80-2000
(Accessed July 27, 2024)
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Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers ::annual report, December 1, 1978 to November 30, 1979
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- NBS IR 80-2000
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NBS IR 80-2000
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NIST Pubs
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Created January 1, 1980, Updated May 19, 2023