TY  - GEN
AU  - Carver, G P
AU  - Rubin, S
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1980-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.80-2000
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1980
TI  - Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers ::annual report, December 1, 1978 to November 30, 1979
ER  -