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Developing a Programmable STEM Detector for the Scanning Electron Microscope

Published

Author(s)

Benjamin Caplins, Bob R. Keller, Jason Holm

Abstract

This is an extended abstract for the 2018 Microscopy and Microanalysis meeting.
Proceedings Title
Microscopy and Microanalysis
Conference Dates
August 5-9, 2018
Conference Location
Baltimore, MD, US

Citation

Caplins, B. , Keller, B. and Holm, J. (2018), Developing a Programmable STEM Detector for the Scanning Electron Microscope, Microscopy and Microanalysis, Baltimore, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925363 (Accessed April 14, 2024)
Created July 31, 2018, Updated April 19, 2022