Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Developing a Programmable STEM Detector for the Scanning Electron Microscope

Published

Author(s)

Benjamin Caplins, Bob R. Keller, Jason Holm

Abstract

This is an extended abstract for the 2018 Microscopy and Microanalysis meeting.
Proceedings Title
Microscopy and Microanalysis
Conference Dates
August 5-9, 2018
Conference Location
Baltimore, MD, US

Citation

Caplins, B. , Keller, B. and Holm, J. (2018), Developing a Programmable STEM Detector for the Scanning Electron Microscope, Microscopy and Microanalysis, Baltimore, MD, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925363 (Accessed November 4, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 31, 2018, Updated April 19, 2022