Marshall, J.
and Zaghloul, M.
(1994),
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.400-93
(Accessed January 19, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Design and testing guides for the CMOS and lateral bipolar-on-SOI test library:
Published
Author(s)
,
Citation
- NIST SP 400-93
Report Number
NIST SP 400-93
Pub Type
NIST Pubs
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1994, Updated May 20, 2023