Deposition Order Dependent Magnetization Reversal of Pressure Graded Co/Pd Films

Published

April 15, 2014

Author(s)

P. K. Greene, Brian Kirby, June W. Lau, Julie Borchers, M .R. Fitzsimmons, Kai Liu

Abstract

Magnetization reversal mechanisms have been investigated in pressure graded Co/Pd multilayer thin films with inverted deposition orders. Structural and magnetic properties have been investigated using x-ray diffraction, transmission electron microscopy, polarized neutron reflectivity, and the first order reversal curve method. When films are initially sputtered at low peressure, magnetic reversal is dominated by domain wall motion laterally across the sample. However, when films are initially sputtered at high pressure some disorder is propagated vertically into the low pressure regions impeding domain wall motion and causing reversal to be dominated by domain wall pinning and rotation.

Citation

Applied Physics Letters

Volume

104

Issue

15

Pub Type

Journals

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Keywords

magnetic multilayers, polarized neutron reflectometry

Citation

Greene, P. , Kirby, B. , Lau, J. , Borchers, J. , Fitzsimmons, M. and Liu, K. (2014), Deposition Order Dependent Magnetization Reversal of Pressure Graded Co/Pd Films, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912068 (Accessed October 16, 2025)