Lee, K.
(1998),
Dependence of Contact Resistance on Current for Good and Bad Ohmic Contacts to Quantized Hall Resistors, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15798
(Accessed October 27, 2025)
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Dependence of Contact Resistance on Current for Good and Bad Ohmic Contacts to Quantized Hall Resistors
Published
Author(s)
Abstract
Dependence of contact resistance on current has been measured for a large number of ohmic contacts to quantized Hall resistors under quantum Hall effect conditions. A definite trend is observed in the current dependencies of resistances of good and bad contacts, regardless of the physical cause of the poor contact.Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
July 6-10, 1998
Conference Location
Washington, DC
Pub Type
Conferences
Download Paper
Keywords
Breakdown of QHE, contact resistance, ohmic contacts, quantum Hall effect, quantized Hall resistor, 2-DEG
Citation
Issues
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Created July 1, 1998, Updated February 19, 2017