Cybersecurity Framework Manufacturing Profile Low Impact Level Example Implementations Guide: Volume 3 - Discrete-based Manufacturing System Use Case
Keith A. Stouffer, Timothy Zimmerman, CheeYee Tang, Michael Pease, Jeffrey Cichonski, Neeraj Shah, Wesley Downard
This guide provides example proof-of-concept solutions demonstrating how available open-source and commercial off-the-shelf (COTS) products could be implemented in discrete-based manufacturing environments to satisfy the requirements in the Cybersecurity Framework (CSF) Manufacturing Profile Low Impact Level. The example proof-of-concept solutions include measured network, device, and operational performance impacts observed during the implementation. Manufacturers should make their own determinations about the breadth of the proof-of-concept solutions they voluntarily implement. Some important factors to consider include: company size, cybersecurity expertise, risk tolerance, and the threat landscape. The CSF Manufacturing Profile can be used as a roadmap for managing cybersecurity risk for manufacturers and is aligned with manufacturing sector goals and industry best practices. The Manufacturing Profile provides a voluntary, risk-based approach for managing cybersecurity activities and cyber risk to manufacturing systems. The Manufacturing Profile is meant to complement but not replace current cybersecurity standards and industry guidelines that the manufacturer is embracing.
Computer security, Cybersecurity Framework (CSF), distributed control systems (DCS), industrial control systems (ICS), information security, manufacturing, network security, programmable logic controllers (PLC), risk management, security controls, supervisory control and data acquisition (SCADA) systems.
, Zimmerman, T.
, Tang, C.
, Pease, M.
, Cichonski, J.
, Shah, N.
and Downard, W.
Cybersecurity Framework Manufacturing Profile Low Impact Level Example Implementations Guide: Volume 3 – Discrete-based Manufacturing System Use Case, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8183A-3
(Accessed December 1, 2022)