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A Custom Integrated Circuit Comparator for High Performance Sampling Applications

Published

Author(s)

Owen B. Laug, T. M. Souders, D. R. Flach
Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Conference Dates
May 12-14, 1992
Conference Location
Secaucus, NJ

Citation

Laug, O. , Souders, T. and Flach, D. (1992), A Custom Integrated Circuit Comparator for High Performance Sampling Applications, Proc. IEEE Instrumentation and Technology Conference (IMTC), Secaucus, NJ, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=25983 (Accessed March 29, 2024)
Created April 30, 1992, Updated October 12, 2021