Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

CRITICALLY EVALUATED ENERGY LEVELS, SPECTRAL LINES, TRANSITION PROBABILITIES, AND INTENSITIES OF SINGLY-IONIZED VANADIUM (V II)

Published

Author(s)

Alexander Kramida, Edward B. Saloman

Abstract

The energy levels, observed spectral lines, and transition probabilities of singly-ionized vanadium, V II, have been compiled. Also included are values for some forbidden lines which may be of interest to the astrophysical community. Experimental Landé g-factors and leading percentages for the levels are included when available as well as Ritz wavelengths calculated from the energy levels. Wavelengths and transition probabilities are reported for 3568 and 1896 transitions, respectively. From the list of observed wavelengths, 407 energy levels are determined. The observed intensities are provided normalized to a common scale. From the newly optimized energy levels, a revised value for the ionization energy is derived, 117930(60) cm−1, corresponding to 14.621(7) eV. This agrees with the previously recommended value, but has a twice larger uncertainty.
Citation
Astrophysical Journal Supplement Series
Volume
231
Issue
2

Keywords

Atomic spectroscopy, critical compilation, energy levels, spectral lines, line identification, Fourier-transform spectra, grating spectroscopy, transition probabilities, singly-ionized vanadium

Citation

Kramida, A. and Saloman, E. (2017), CRITICALLY EVALUATED ENERGY LEVELS, SPECTRAL LINES, TRANSITION PROBABILITIES, AND INTENSITIES OF SINGLY-IONIZED VANADIUM (V II), Astrophysical Journal Supplement Series, [online], https://doi.org/10.3847/1538-4365/aa7de6 (Accessed May 26, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 11, 2017, Updated July 3, 2023