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PUBLICATIONS

Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation

Published

Author(s)

Jared Wahlstrand, Edwin J. Heilweil

Abstract

We perform contactless mobility measurements in ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump, THz probe experiment. By using two-photon excitation, one excites the entire sample thickness to produce measurable signals at 1013 carriers/cm3 or higher densities. For ZnTe and GaSe samples, the mobility measured using two-photon excitation is higher than that measured with one-photon excitation.
Citation
Optics Express
Volume
26
Issue
23
Pub Type
Journals

Download Paper

DOI Link

Keywords

bulk semiconductors, mobility, terahertz, two-photon excitation
Spectroscopy, Semiconductors and Optical physics and communications

Citation

Wahlstrand, J. and Heilweil, E. (2018), Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation, Optics Express, [online], https://doi.org/10.1364/OE.26.029848 (Accessed October 7, 2025)

Issues

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Created October 30, 2018, Updated October 12, 2021
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