Conformance Test Suite for CBEFF Biometric Information Records

Published

September 29, 2007

Author(s)

Yooyoung Lee, Fernando L. Podio, Mark Jerde

Abstract

Deployment of standards-based biometric technologies is expected to significantly raise levels of security for critical infrastructures that has not been possible to date with other technologies. These systems require a comprehensive set of technically sound standards that meet the customer¿s needs. The existence of standards alone, however, is not enough to demonstrate that products meet the technical requirements specified in the standards. Conformance testing captures the technical description of a standard and measures whether an implementation faithfully implements the standard. Conformity assessment provides confidence to users through programs that demonstrate the conformity of products to specific standards. This paper discusses a Conformance Test Suite (CTS) for Biometric Information Records (BIRs) claiming conformance to data structures specified in Common Biometric Exchange Formats Framework (CBEFF) standards. The paper summarizes conformance testing procedures and criteria for testing these data structures. A conformance testing architecture and a CTS implementation developed at the National Institute of Standards and Technology (NIST) to assess conformance to these CBEFF data structures is described. Ongoing and future work is discussed.

Proceedings Title

Proceedings of IEEE Conference on Biometrics: Theory, Applications and Systems

Conference Dates

September 27-29, 2007

Conference Location

Washington, DC

Conference Title

IEEE Conference on Biometrics: Theory, Applications and Systems

Pub Type

Conferences

Download Paper

Local Download

Keywords

Testing, Conformance, Biometric Information Records, Biometrics, Common Biometric Exchange Formats Framework, Standards, Biometrics, Test Suites

Citation

Lee, Y. , Podio, F. and Jerde, M. (2007), Conformance Test Suite for CBEFF Biometric Information Records, Proceedings of IEEE Conference on Biometrics: Theory, Applications and Systems, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51241 (Accessed April 20, 2024)