TY  - CONF
AU  - Yooyoung Lee
AU  - Fernando Podio
AU  - Mark Jerde
C2  - Proceedings of IEEE Conference on Biometrics: Theory, Applications and Systems, Washington, DC
DA  - 2007-09-29
LA  - en
PB  - Proceedings of IEEE Conference on Biometrics: Theory, Applications and Systems, Washington, DC
PY  - 2007
TI  - Conformance Test Suite for CBEFF Biometric Information Records
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51241
ER  -