Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Compression Guidance for 1000 ppi Palm and Hand Friction Ridge Imagery

Published

Author(s)

John M. Libert, John D. Grantham, Craig I. Watson

Abstract

NIST provided in a special publication guidance for the compression of 1000 ppi fingerprint images using Part I of the JPEG 2000 standard. The present document extends the Guidance to the compression of 1000 ppi palm and whole-hand images. The NIST Spectral Image Validation Verification (SIVV) metric was used to determine JPEG 2000 compression ratios at which palm and hand images exhibit spectral fidelity to non-compressed source images comparable to that of fingerprint images compressed at 10:1. The investigators discuss the effect of untextured regions in enabling compression ratios as high as 12:1 for palms and 22:1 for whole hand images as indicated by the spectral analysis. However, they note several factors contraindicating deviation of compression ratio from that recommended in the Guidance. Hence, NIST recommends that a single compression ratio, 10:1, be applied to all friction ridge impression types to ensure interoperability, in general, and support of latent matching, in particular.
Citation
NIST Interagency/Internal Report (NISTIR) - 8260
Report Number
8260

Keywords

palm print, hand print, JPEG 2000, friction ridge skin, Spectral Image Validation Verification metric, SIVV

Citation

Libert, J. , Grantham, J. and Watson, C. (2019), Compression Guidance for 1000 ppi Palm and Hand Friction Ridge Imagery, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8260 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 2, 2019