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Complex Permittivity Determination from Propagation Constant Measurements

Published

Author(s)

Michael D. Janezic, Jeffrey A. Jargon

Abstract

This letter presents a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods, a network analyzer calibration is unnecessary since calibrated scattering parameters are not required. We use measurements in X-band waveguide to show that this technique compares well with the transmission/reflection and cylindrical cavity methods.
Citation
IEEE Microwave and Guided Wave Letters
Volume
9
Issue
2

Keywords

dielectric constant, measurement, permittivity, propagation constant

Citation

Janezic, M. and Jargon, J. (1999), Complex Permittivity Determination from Propagation Constant Measurements, IEEE Microwave and Guided Wave Letters, [online], https://doi.org/10.1109/75.755052 (Accessed June 16, 2024)

Issues

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Created February 1, 1999, Updated November 10, 2018