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Comparison of Two Methods for Determining Surface Roughness From Spectrophotometry Data

Published

Author(s)

L D. Rotter

Abstract

The method of determining the surface roughness of a transparent solid interface by fitting spectrophotometric transmittance and/or reflectance data with a function that models the surface roughness as an effective medium layer is compared with scalar scattering theory within the Kirchoff approximation. The former method does not reproduce the features of the latter method, either for reflectance data when the surface roughness is large, or for transmittance data. For reflectance data when the surface roughness is small, both methods produce qualitatively similar, though quantitatively different, results.
Citation
Applied Optics

Keywords

effective medium, ellipsometry, Kirchoff approximation, reflectance, solid interfaces, spectrophotometry, surface roughness

Citation

Rotter, L. (2017), Comparison of Two Methods for Determining Surface Roughness From Spectrophotometry Data, Applied Optics (Accessed April 20, 2024)
Created February 19, 2017