Rotter, L.
(2017),
Comparison of Two Methods for Determining Surface Roughness From Spectrophotometry Data, Applied Optics
(Accessed December 10, 2024)
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Comparison of Two Methods for Determining Surface Roughness From Spectrophotometry Data
Published
Author(s)
Abstract
The method of determining the surface roughness of a transparent solid interface by fitting spectrophotometric transmittance and/or reflectance data with a function that models the surface roughness as an effective medium layer is compared with scalar scattering theory within the Kirchoff approximation. The former method does not reproduce the features of the latter method, either for reflectance data when the surface roughness is large, or for transmittance data. For reflectance data when the surface roughness is small, both methods produce qualitatively similar, though quantitatively different, results.Citation
Applied Optics
Pub Type
Journals
Keywords
effective medium, ellipsometry, Kirchoff approximation, reflectance, solid interfaces, spectrophotometry, surface roughness
Citation
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Created February 19, 2017