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Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples

Published

Author(s)

Yu Lei, Raghu N. Kacker

Abstract

A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy to software product lines. A unique challenge in these works is dealing with a potentially large number of constraints among different features. In this paper, we propose a novel constraint handling strategy that uses minimum invalid tuples (MITs) as an alternative of traditional constraint solver. Our approach systematically derives all MITs from a software product line, and uses them to quickly determine the validity of a test configuration during test generation. We report a test generation tool called LOOKUP that integrates the proposed constraint handling strategy with a general test generation algorithm called IPOG-C. Experimental results show that LOOKUP performs considerably better than two existing test generation tools in terms of test size and execution time.
Proceedings Title
15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)
Conference Dates
January 9-11, 2014
Conference Location
Miami, FL, US
Conference Title
15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)

Keywords

Combinatorial Testing, Constraints, covering Arrays Feature Model

Citation

Lei, Y. and Kacker, R. (2014), Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples, 15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014) , Miami, FL, US, [online], https://doi.org/10.1109/HASE.2014.18, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=914788 (Accessed May 28, 2024)

Issues

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Created January 8, 2014, Updated October 12, 2021