Eppeldauer, G.
(1998),
Chopped Radiation Measurements With Large Area Si Photodiodes, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 9, 2026)
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Chopped Radiation Measurements With Large Area Si Photodiodes
Published
Author(s)
Citation
Journal of Research (NIST JRES) -
Volume
103 No. 2
NIST Pub Series
Pub Type
NIST Pubs
Keywords
Bode plot, chopped light, frequency dependence, measurement, optical radiation, photocurrent, photodiode, radiometer, reponsivity, silicon
Citation
Issues
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Created March 1, 1998, Updated February 17, 2017