Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Characterizing the Mechanical Properties and Degradation of Thin Polymer Membranes

Published

Author(s)

Christopher M. Stafford, Jun Y. Chung, Junghyun Lee

Abstract

The elasticity, strength, and toughness of thin polymer membranes are of considerable interest since direct knowledge of these key mechanical properties can provide insight into performance, durability, and underlying degradation mechanisms that occur over a membrane’s operational lifetime. However, there is a considerable lack of knowledge about these key mechanical properties due to the lack of appropriate measurement tools at the nanometer scale. Hence, research has focused on direct performance measurements aided by chemical and structural analysis, such as spectroscopy and scattering techniques. In this work, we utilize the phenomena of wrinkling and cracking as a tool for measuring the modulus, fracture strength, and onset fracture strain of ultrathin polymer membranes .
Proceedings Title
American Chemical Society Fall 2011 National Meeting & Exposition
Volume
242
Conference Dates
August 28-September 1, 2011
Conference Location
Denver, CO
Conference Title
241st ACS National Meeting, Division of Polymeric Materials: Science and Engineering: PMSE Preprints

Keywords

wrinkling, cracking, membranes, thin films, mechanical properties, water, reverse osmosis

Citation

Stafford, C. , Chung, J. and Lee, J. (2011), Characterizing the Mechanical Properties and Degradation of Thin Polymer Membranes, American Chemical Society Fall 2011 National Meeting & Exposition , Denver, CO (Accessed June 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 28, 2011, Updated February 19, 2017