Characterization of Vertical-Cavity Semiconductor Structures

David H. Christensen; S. M. Crochiere; C. A. Parsons; Joseph G. Pellegrino; Robert K. Hickernell; R. S. Rai

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PUBLICATIONS

Characterization of Vertical-Cavity Semiconductor Structures

Published

December 15, 1992

Author(s)

David H. Christensen, S. M. Crochiere, C. A. Parsons, Joseph G. Pellegrino, Robert K. Hickernell, R. S. Rai

Citation

Journal of Applied Physics

Volume

Issue

Pub Type

Journals

Citation

Christensen, D. , Crochiere, S. , Parsons, C. , Pellegrino, J. , Hickernell, R. and Rai, R. (1992), Characterization of Vertical-Cavity Semiconductor Structures, Journal of Applied Physics (Accessed April 27, 2026)

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Created December 14, 1992, Updated October 12, 2021

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