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Characterization of Vertical-Cavity Semiconductor Structures

Published

Author(s)

David H. Christensen, S. M. Crochiere, C. A. Parsons, Joseph G. Pellegrino, Robert K. Hickernell, R. S. Rai
Citation
Journal of Applied Physics
Volume
72
Issue
12

Citation

Christensen, D. , Crochiere, S. , Parsons, C. , Pellegrino, J. , Hickernell, R. and Rai, R. (1992), Characterization of Vertical-Cavity Semiconductor Structures, Journal of Applied Physics (Accessed May 25, 2024)

Issues

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Created December 14, 1992, Updated October 12, 2021