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PUBLICATIONS

Characterization of Vertical-Cavity Semiconductor Structures

Published

Author(s)

David H. Christensen, S. M. Crochiere, C. A. Parsons, Joseph G. Pellegrino, Robert K. Hickernell, R. S. Rai
Citation
Journal of Applied Physics
Volume
72
Issue
12
Pub Type
Journals

Citation

Christensen, D. , Crochiere, S. , Parsons, C. , Pellegrino, J. , Hickernell, R. and Rai, R. (1992), Characterization of Vertical-Cavity Semiconductor Structures, Journal of Applied Physics (Accessed October 2, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 14, 1992, Updated October 12, 2021
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