There are many error sources when using infrared radiation thermography to measure the temperature distribution of the tool, workpiece, and chip during metal cutting. It is important to understand how these error sources affect the measurement uncertainty. Some are familiar to anyone performing thermography measurements, such as uncertainties in the basic camera calibration. However, metal cutting presents unique measurement challenges due to factors such as the high magnification required, high surface speeds, polarization effects, micro-blackbody effects, and changing emissivity as chips form. This paper presents highlights of the current state of our efforts to catalog and characterize error sources and resulting uncertainties.
Proceedings Title: SPIE Defense, Security, and Sensing 2009 Conference - Thermosense XXXI
Conference Dates: April 13-17, 2009
Conference Location: Orlando, FL
Pub Type: Conferences
uncertainty, metal cutting, dual spectrum, high speed imaging