Cohen, J.
(1975),
Characterization of sharp points and edges by electrical breakdown:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.75-908
(Accessed June 2, 2023)
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Characterization of sharp points and edges by electrical breakdown:
Published
Author(s)
Citation
- NBS IR 75-908
Report Number
NBS IR 75-908
Pub Type
NIST Pubs
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Citation
Created January 1, 1975, Updated May 19, 2023