TY - GEN AU - Julius Cohen C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1975-01-01 05:01:00 DO - https://doi.org/10.6028/NBS.IR.75-908 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1975 TI - Characterization of sharp points and edges by electrical breakdown: ER -