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PUBLICATIONS

Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry

Published

Author(s)

Huibin Zhu, Allen R. Hefner Jr., Jih-Sheng Lai

Abstract

The significance of interconnect parasitics of power electronics system is their affects on converters' EMI-related performances, such as voltage/current spikes, dv/dt, di/dt, conducted/radiated EMI noise, and the like.  In this paper, a time domain refle
Proceedings Title
Proc., 1998 Power Electronics Specialists Conference (PESC'98)
Conference Dates
May 17-22, 1998
Conference Location
Fukuoka, JA
Conference Title
1998 Power Electronics Specialists Conference (PESC'98)
Pub Type
Conferences

Download Paper

Local Download

Keywords

IGBT, interconnect characterization, interconnect modeling, reflectometry, time domain
Advanced communications and Electronics

Citation

Zhu, H. , Hefner, A. and Lai, J. (1998), Characterization of Power Electronics System Interconnect Parasitics Using Time Domain Reflectometry, Proc., 1998 Power Electronics Specialists Conference (PESC'98), Fukuoka, JA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=10048 (Accessed October 18, 2025)

Issues

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Created December 31, 1998, Updated February 19, 2017
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