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Characterization of junction uniformity in Nb/NbxSi¬1-x/Nb Josephson junctions through automated probing at room temperature and 4K

Published

Author(s)

Ian W. Haygood, Eric R. Edwards, Anna E. Fox, Matthew R. Pufall, Michael L. Schneider, William H. Rippard, Paul D. Dresselhaus, Samuel P. Benz
Citation
IEEE Transactions on Applied Superconductivity
Volume
29
Issue
8

Keywords

Superconducting Electronics, Josephson Junctions, superconducting thin films, superconducting devices

Citation

Haygood, I. , Edwards, E. , Fox, A. , Pufall, M. , Schneider, M. , Rippard, W. , Dresselhaus, P. and Benz, S. (2019), Characterization of junction uniformity in Nb/NbxSi¬1-x/Nb Josephson junctions through automated probing at room temperature and 4K, IEEE Transactions on Applied Superconductivity, [online], https://doi.org/10.1109/TASC.2019.2922225 (Accessed November 30, 2021)
Created November 4, 2019, Updated February 3, 2020