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PUBLICATIONS

Characterization of junction uniformity in Nb/NbxSi¬1-x/Nb Josephson junctions through automated probing at room temperature and 4K

Published

Author(s)

Ian W. Haygood, Eric R. Edwards, Anna E. Fox, Matthew R. Pufall, Michael L. Schneider, William H. Rippard, Paul D. Dresselhaus, Samuel P. Benz
Citation
IEEE Transactions on Applied Superconductivity
Volume
29
Issue
8
Pub Type
Journals

Download Paper

https://doi.org/10.1109/TASC.2019.2922225
Local Download

Keywords

Superconducting Electronics, Josephson Junctions, superconducting thin films, superconducting devices
Superconducting electronics

Citation

Haygood, I. , Edwards, E. , Fox, A. , Pufall, M. , Schneider, M. , Rippard, W. , Dresselhaus, P. and Benz, S. (2019), Characterization of junction uniformity in Nb/NbxSi¬1-x/Nb Josephson junctions through automated probing at room temperature and 4K, IEEE Transactions on Applied Superconductivity, [online], https://doi.org/10.1109/TASC.2019.2922225 (Accessed April 26, 2024)

Created November 4, 2019, Updated February 3, 2020