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Characterization of a high frequency probe assembly for integrated circuit measurements:

Published

Author(s)

Ramon L Jesch
Citation
- NBS TN 663
Report Number
NBS TN 663

Citation

Jesch, R. (1975), Characterization of a high frequency probe assembly for integrated circuit measurements:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.663 (Accessed April 12, 2024)
Created January 1, 1975, Updated May 19, 2023