Jesch, R.
(1975),
Characterization of a high frequency probe assembly for integrated circuit measurements:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.663
(Accessed December 8, 2024)
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Characterization of a high frequency probe assembly for integrated circuit measurements:
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Author(s)
Citation
- NBS TN 663
Report Number
NBS TN 663
Pub Type
NIST Pubs
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Created January 1, 1975, Updated May 19, 2023