@misc{1154101, author = {Ramon L Jesch}, title = {Characterization of a high frequency probe assembly for integrated circuit measurements:}, year = {1975}, month = {1975-01-01 05:01:00}, publisher = {, National Institute of Standards and Technology, Gaithersburg, MD}, doi = {https://doi.org/10.6028/NBS.TN.663}, language = {en}, }