Olthoff, J.
and Van Brunt, R.
(1993),
Characterization and Calibration of a BIT/RGA for Use as a Plasma Processing Diagnostic, SEMATECH Technology Transfer Report 9304161A-XFR| publ. by SEMATECH: AustinTX, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=21541
(Accessed September 19, 2024)