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PUBLICATIONS

CCM: A Tool for Measuring Combinatorial Coverage of System State Space

Published

Author(s)

Itzel Dominguez, D. Richard Kuhn, Raghu N. Kacker, Yu Lei

Abstract

This poster presents some measures of combinatorial coverage that can be helpful in estimating residual risk related to insufficient testing of rare interactions, and a tool for computing these measures.
Conference Dates
October 10-11, 2013
Conference Location
Baltimore, MD, US
Conference Title
ACM / IEEE International Symposium on Empirical Software Engineering and Measurement
Pub Type
Conferences

Download Paper

DOI Link

Keywords

combinatorial testing, factor covering array, state-space coverage, t-way testing, t-way testing
Information technology

Citation

Dominguez, I. , Kuhn, D. , Kacker, R. and Lei, Y. (2013), CCM: A Tool for Measuring Combinatorial Coverage of System State Space, ACM / IEEE International Symposium on Empirical Software Engineering and Measurement , Baltimore, MD, US, [online], https://doi.org/10.1109/ESEM.2013.44 (Accessed October 16, 2025)

Issues

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Created October 9, 2013, Updated October 12, 2021
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